Atomic force microscopy
PSIA XE150 in Uppsala
The PSIA XE150 uses a probe to scan sample surfaces. Its documented modes include contact and non-contact AFM, alongside force-related measurements. This makes it a useful instrument to investigate when surface topography or local surface response matters. Sample mounting and the appropriate measurement mode should be discussed before planning a visit.
- Manufacturer
- PSIA
- Model
- XE150
- Technique
- Atomic force microscopy
- Location
- Uppsala, Sweden
Questions to clarify for your project
- Do you need topography, roughness or a force-related measurement?
- Can the surface tolerate probe contact?
Explore the next step with Abstract
Create an account to search detailed equipment records, compare documented capabilities and build a research shortlist. Facility access, project acceptance, rates and scheduling must be confirmed separately.